A Thin Film X-ray Diffractometer is a precision-engineered instrument designed for the detailed analysis of thin films. It provides information about ...
A Single-Crystal X-ray Diffractometer is a highly specialised scientific instrument designed for precise elucidation of the atomic structure of crysta...
A Multipurpose X-ray Diffractometer employs X-ray diffraction techniques to analyse crystalline structures, making it suitable for investigating vario...
The Physical Property Measurement System is a cutting-edge cryogenic platform designed for material physical characterisation. With precise temperatur...